As the semiconductor industry continues to miniaturize chip components—essential for computers, implantable drug dispensers, cell phones, and other devices—the demand for ever-more detailed information from Scanning Electron Microscope (SEM) images has grown. Although the exquisite, atomic-scale resolution of an SEM can’t be improved, researchers at NIST have begun a multi-year study to reduce uncertainties in the measurements inferred from SEM images. To do so, NIST physicist John Villarrubia a

The Mariners’ lab recently welcomed a new addition - a scanning electron microscope! 🔬 With this powerful microscope, we’ll be able to analyze a wider spectrum of materials and see not only the surface of an object but also its composition, helping us better visualize what is happening to our objects as we test them. Conservation Scientist Molly McGath, PhD. and Senior Archaeological Conservator Elsa Sangouard explain why this new tool is such a game-changer for The Mariners’. ✨ *This project w