JSTOR Daily

Using on-Line Sensors in Statistical Process Control

As manufacturing technology moves toward more computerized automation, statistical process control (SPC) techniques must adapt to keep pace with the new environment and take advantage of the ...
Electronic Design

Role of statistical process control in semiconductor yield management

There is a boom in the volume of semiconductor devices being manufactured, and the boom is primarily credited to the proliferation of Internet of Things (IoT)-based devices in our daily lives. IoT ...
ISA

Author Q&A: Nonlinear Model-Based Control - Using First-Principles Models in Process Control

Author Dr. R. Russell Rhinehart discusses his new book, Nonlinear Model-Based Control: Using First-Principles Models in Process Control, and explains why nonlinear first-principles models should be ...
Semiconductor Engineering

Using Test And Metrology Data For Dynamic Process Control

Advanced packaging is transforming semiconductor manufacturing into a multi-dimensional challenge, blending 2D front-end wafer fabrication with 2.5D/3D assemblies, high-frequency device ...
Semiconductor Engineering

The Challenges Of Process Control On FinFETs And FD-SOI

Across the semiconductor industry, both FD-SOI and finFET transistor technologies are in high volume production, with IC manufacturers looking to extend both technologies to gain additional ...