If you've ever tenuously probed an expensive IC in a surface-mount package, you'll appreciate these new test adjuncts from Emulation Technology (ET—Santa Clara, Calif.). It's rolling out test clips ...

The market growth is driven by increasing semiconductor testing volumes, advanced node scaling, rising adoption of high-frequency and fine-pitch probes, and expanding OSAT and wafer-level testing ...

Plastronics has developed a stamped alternative for traditional fine-pitch ‘pogo-pins’ – the spring- loaded contacts used for temporary electrical connections in test jigs, for example. “For decades ...