Recently, defect detection systems using artificial intelligence (AI) sensor data have been installed in smart factory manufacturing sites. However, when the manufacturing process changes due to ...

The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...

Canopus AI has introduced 'Metrospection,' an AI-driven approach designed to improve workflows in wafer and mask metrology.

Photo-induced force microscopy (PiFM) is a sophisticated nanoscale characterization approach that combines the elevated spatial resolution of atomic force microscopy (AFM) with infrared (IR) ...

New nRF54L Series SoC with NPU and Nordic Edge AI Lab make on-device intelligence easily accessible and radically power-efficient LAS VEGAS, Jan. 6, 2026 /PRNewswire/ -- Nordic Semiconductor, a global ...