Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...

SE: Why is applying functional test content so challenging today? Ruiz: There are a couple of different factors that make successfully applying functional patterns on the tester a challenge. In fact, ...

Check out our NI Connect 2022 coverage. For years, NI has focused on the ability of software to tie together its test equipment and evaluate vast quantities of data to help companies reduce their time ...