Semiconductor IP platform provider Virage Logic has announced its third-generation Self-Test and Repair (STAR) Memory System. The third-generation STAR Memory System provides its predecessor's on-chip ...
Generic test and repair approaches to embedded memory have hit their limit. Smaller feature sizes, such as 130 nm and 90 nm, have made it possible to embed multiple megabits of memory into a single ...
The semiconductor capital equipment market is on fire, and the memory chip test equipment sector is no different. But it is getting much more difficult on the memory side. Memory test vendors are ...
COLOGNE, Germany--(BUSINESS WIRE)--INFICON GmbH from Cologne, one of the world's leading manufacturers of leak testing devices and instruments, presents the latest generation of mobile leak detectors ...
What is a memory leak? A memory leak is a phenomenon in which a program holds on to memory it has used without releasing it. When a memory leak occurs, the computer system's available memory gradually ...
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