Two test strategies are used to test virtually all IC logic—automatic test pattern generation (ATPG) with test pattern compression, and logic built-in self-test (BIST). For many years, there was a ...

In today’s highly competitive semiconductor industry, chip-design companies strive for competitive advantages by optimizing designs for PPA (Power, Performance, Area). Along with the functional logic, ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Just as the oscilloscope is the instrument of choice for analog electronics, and the spectrum analyzer is preferred for RF measurement, the logic analyzer is the go-to instrument for digital system ...

Do you have a knack for numbers? This test is designed to test your logic and mathematical IQ. It will assess your ability to logically discern numerical patterns and to apply them to new contexts, to ...