MILPITAS, Calif., July 10, 2018 /PRNewswire/ -- Today KLA-Tencor Corporation (NASDAQ: KLAC) announced two new defect inspection products, addressing two key challenges in tool and process monitoring ...

“Our customers are highly motivated to continue to extend optical inline defect inspection beyond the 20nm node,” said Keith Wells, vice president and general manager of the Wafer Inspection (WIN) ...

The sensor, Si-NIR StreamLine, combines rugged reliability, wide spectral coverage, and flexible interfacing options to deliver continuous material analysis from factory floors to remote field ...

MILPITAS, Calif., June 22, 2021 /PRNewswire/ -- Today, KLA Corporation (NASDAQ: KLAC) announced the launch of four new products for automotive chip manufacturing: the 8935 high productivity patterned ...

According to MarketsandMarkets™, the global inline metrology market is projected to reach USD 2.63 billion in 2026 and USD ...

KLA has announced the launch of four new products for automotive chip manufacturing: the 8935 high productivity patterned wafer inspection system, the C205 broadband plasma patterned wafer inspection ...

HEIDELBERG, Germany — April 25, 2017 — The print media industry frequently faces demands for high quality in combination with ever shorter throughput times, complex products, or just-in-time ...

The use of design-based care areas on inspection tools [1, 2] to characterize defects has been well established in recent years. However, the implementation has generally been limited to specific ...

In any offshore facility, it is important to monitor oil in produced water because any sheen around the platform can attract costly fines for surpassing the discharge permit limits for oil (Figure 1).

A technical paper titled “In situ electrical property quantification of memory devices by modulated electron microscopy” was published by researchers at Hitachi High-Tech Corporation, KIOXIA ...