This Collection calls for submissions of original research into techniques that facilitate the advancement of deep learning for image analysis and object detection, driving computer vision forward and ...
A new publication from Opto-Electronic Advances, 10.29026/oea.2024.230034 discusses how the synergy of traditional techniques and deep learning enables single-frame high-precision fringe pattern ...
Leica Microsystems has released version 14 of Aivia, its flagship image analysis solution. This update introduces a suite of new features and enhancements for deep learning–based cell segmentation, ...
Investigators rely on particle characterization methods to gain a deeper understanding of key properties that influence both the manufacturing process and the quality of the final product. As ...
Read more about how machine learning and deep learning differ, where each is used, and how businesses choose between them in real scenarios.