Test engineers often are challenged with the task of simulating the environment in which the unit under test (UUT) will operate. To implement such a test, engineers use hot mock-up, embedded software, ...
The latest update to the Corelis ScanExpress JET (JTAG Embedded Test) library has pushed processor support to over 1000, with the addition of such key processor families as the Freescale Power ...
As chips become more heterogeneous with more integrated functionality, testing them presents increasing challenges — particularly for high-speed system-on-chip (SoC) designs with limited test pin ...
Microprocessor testing and self-test techniques constitute a critical domain in ensuring the reliability and performance of modern computing devices. These methodologies encompass both hardware and ...
Many books cover functional testing techniques, but relatively few also cover technical testing. “The Software Test Engineer’s Handbook, 2nd Edition” (US$49.95, 560 pages) from O’Reilly fills that gap ...
Over the last decade, there has been a move away from powered-up digital in-circuit vector testing to unpowered analog-based (vectorless) device-pin opens testing for large and sometimes small digital ...
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