The ETS Series modular test instruments target engineers who develop custom test equipment that support functional test. The modular instruments are specifically for embedded operation, which allows ...

Assessing the robustness of an electronic product is integral to successful design and performance. Highly accelerated life testing (HALT) is an important testing tool for this purpose, and its ...

Continuing component miniaturization and ever-increasing board densities are good news for consumers. The latest electronic commodities bristle with features, gobble less real estate, operate at ...

During standardized chip fabrication, integrate circuit (IC) testing is conducted repeatedly to inspect the chips once they are manufactured. IC testing begins with wafer penetration before etched ...

Representing the most recent generation of double-data-rate (DDR) SDRAM memory, DDR4 and low-power LPDDR4 together provide improvements in speed, density, and power over DDR3. However, such speed and ...

As chipmakers move towards finer geometries, IC designs are obviously becoming more complex and expensive. Given the enormous risks involved, chipmakers must ensure the quality of the parts before ...

Tobyhanna Army Depot has developed a new strategy to combat test equipment obsolescence by employing modern hardware and software technologies. The benefits of this include lower maintenance costs, ...