“The ideal is to achieve comprehensive validation without redundant effort. Coverage metrics helps approximate this ideal by acting as heuristic measures that quantify verification completeness, and ...

Constrained random test pattern generation entered the scene a couple of decades ago as a better way to spend time and resources for the creation of stimulus. Stimulus definition had become an arduous ...

You certainly can’t improve something unless you measure it. So, how do you know if the functionality of your design has been verified completely? One metric that helps answer this question is ...

If you don’t measure something you certainly can’t improve it in any meaningful way. This is especially important with a process that can never be completed due to the sheer magnitude of the ...

Newark, March 9, 2010 - nSys Design Systems, offering the world’s largest portfolio of Verification IPs, announced the availability of Functional Coverage Test Suites for its nSys Verification Suite ...

System-on-a-chip (SoC) functional verification involves integrating multiple intellectual property (IP) blocks. Accordingly, understanding how to define, measure, correlate, and analyze appropriate IP ...

For years the process of ASIC and FPGA design and verification debug consisted primarily of comprehending the structure and source code of the design with waveforms showing activity over time, based ...

PARTNER CONTENT Given the size and complexity of modern semiconductor designs, functional verification has become a dominant phase in the development cycle. Coverage lies at the very heart of this ...

Chip-verification teams often confront one fundamental question: “How well is the verification process exercising the design?” Attempts to answer this query have led to the development of several ...