Vertical-cavity surface-emitting laser (VCSEL)-based parallel optical interconnects are becoming vital components of communications systems for which short distance (less than 300 meters) and high ...

Reliability testing has long served as a method of ensuring that semiconductor devices maintain their desired performance over a given lifetime. As IC manufacturers continue to introduce new and ...

Decreased system reliability due to overloaded power supplies is a common engineering challenge. In this Q&A-style article submitted by Allied Electronic & Automation, David Norton, technical ...

Wireless solutions are often thought to be tainted by susceptibility to interference and lack of reliability. Despite recent technical improvements, wireless transmission technology still elicits ...

In today’s world, so-called “high-performance, sustainable” facilities are a dime a dozen. But many of these buildings rely on overly complex mechanical systems to carry out their mission. While these ...

Keithley Instruments has announced the S510, a high-channel-count, turnkey semiconductor reliability test system for use in lifetime modeling of advanced ULSI CMOS processes at the 65-nm node and ...

Reliability testing has long served as a method of ensuring that semiconductor devices maintain their desired performance over a given lifetime. As IC manufacturers continue to introduce new and ...