Most circuit designers are familiar with diode dynamic characteristics, such as charge storage, voltage-dependent capacitance, and reverse recovery time. Manufacturers less commonly acknowledge and ...

Laser diodes, the devices that illuminate telecom fiber-optic cables, require light-current-voltage (L-I-V) measurements during production. These measurements let you characterize a laser diode's ...

Semiconductor testing has traditionally functioned as a stable screening step in the manufacturing flow so that failing devices can be identified and separated prior to packaging. Test infrastructure ...

When checking and verifying capacitors, inductors, diodes, bipolar transistors, and cables, the gamut of test methods can range from those used to confirm a defective component to identifying the ...

It’s remarkable how tiny electronics have become. Heaven knows what an old-timer whose experience started with tubes must think, to go from solder tags to SMD in a lifetime is some journey. Even the ...

The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...

In switch-mode power supplies, saturation losses represent the main source of inefficiency in the power transistor. Because those losses are a function of a transistor's saturation voltage, it's ...