Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Such features can make defect tracking fun and less of a boring activity for developers. It will help developers in generating better bug reports, making the entire process of defect management easier ...

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.

Additive manufacturing (AM) encompasses a suite of layer-by-layer fabrication techniques that enable the rapid production of complex geometries from digital models. Central to the industrial adoption ...